VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007 : proceedings, Sacramento, California, USA, October 30-November 1, 2007 - IEEE Symposium on Visual Analytics Science and Technology; Ribarsky, William; Dill, John; IEEE Computer Society Technical Committee on Visualization and Graphics (IEEE, 2007)
Bibliographic Level Mode of Issuance: Monograph
Keywords: Digital computer simulation : Congresses; Visual analytics : Congresses; Information visualization : Congresses; Computer graphics : Congresses; Engineering & Applied Sciences; Computer Science