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Cookie SettingsIEEE Semiconductor Thermal Measurement and Management Symposium, IEEE Components, Hybrids, and Manufacturing Technology Society, IEEE Components, M. A. T. S. S. C. A., IEEE Components, P. a. M. T. S. S. C. A., IEEE Semiconductor Thermal Measurement and Management Symposium Corporate Author, IEEE, C., . . . IEEE, I. S. C. P. (1991). Proceedings. Institute of Electrical and Electronics Engineers.
Chicago Style CitationIEEE Semiconductor Thermal Measurement and Management Symposium, Hybrids IEEE Components, Manufacturing And Technology Society Staff Corporate Author IEEE Components, Packaging and Manufacturing Technology Society Staff Corporate Author IEEE Components, IEEE Semiconductor Thermal Measurement and Management Symposium Corporate Author, Components IEEE, Institute of Electrical and Electronics Engineers IEEE, Hybrids IEEE Components, and Inc. Staff Content Provider IEEE. Proceedings. New York, NY: Institute of Electrical and Electronics Engineers, 1991.
MLA CitationIEEE Semiconductor Thermal Measurement and Management Symposium, et al. Proceedings. Institute of Electrical and Electronics Engineers, 1991.
Harvard Style CitationIEEE Semiconductor Thermal Measurement and Management Symposium, IEEE Components, H., IEEE Components, M. A. T. S. S. C. A., IEEE Components, P. a. M. T. S. S. C. A., IEEE Semiconductor Thermal Measurement and Management Symposium Corporate Author, IEEE, C., . . . IEEE, I. S. C. P. 1991. Proceedings. New York, NY: Institute of Electrical and Electronics Engineers.
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