Institute of Electrical and Electronics Engineers. (2015). IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1: IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM). IEEE. https://doi.org/10.1109/IEEESTD.2015.7358452
Chicago-tyylinen lähdeviittausInstitute of Electrical and Electronics Engineers. IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1: IEC/IEEE International Standard for the Common Test Interface Pin Map Configuration for High-density, Single-tier Electronics Test Requirements Utilizing IEEE Std 1505(TM). Piscataway, New Jersey: IEEE, 2015. https://doi.org/10.1109/IEEESTD.2015.7358452.
MLA-viiteInstitute of Electrical and Electronics Engineers. IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1: IEC/IEEE International Standard for the Common Test Interface Pin Map Configuration for High-density, Single-tier Electronics Test Requirements Utilizing IEEE Std 1505(TM). IEEE, 2015. https://doi.org/10.1109/IEEESTD.2015.7358452.
Harvard-tyylinen lähdeviittausInstitute of Electrical and Electronics Engineers. 2015. IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1: IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM). Piscataway, New Jersey: IEEE.
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