IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1 : IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

E-kirja

Institute of Electrical and Electronics Engineers , author, issuing body

IEEE 2015.

Tallennettuna:

Muut nimekkeet

63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505
IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1

Ulkoasu

1 online resource (175 pages)

Kieli

englanti

Julkaisija

Piscataway, New Jersey : IEEE, 2015.

Luokitus

dlc TK7887.5 .I578 2015

Dewey-luokitus

004.7

Aiheet

Computer input-output equipment.